Delay fault test circuitry and related method
Delay fault testing with IEEE 1149.1
Delay management system
Delay-fault testing method, related system and circuit
Delayed processing of site-aware objects
Delta time event based test system
Design for test of analog module systems
Design for test of analog module systems
Deskewed differential detector employing analog-to-digital...
Detecting communication errors across a chip boundary
Detecting corruption of configuration data of a programmable...
Detecting interport faults in multiport static memories
Detection circuit and method for AC coupled circuitry
Determining a length of the instruction register of an...
Determining and reporting data accessing activity of a program
Determining edge relationship between clock signals
Determining the health of a desired node in a multi-level...
Determining timing associated with an input or output of an...
Deterministic bist architecture including MISR filter
Deterministic BIST architecture tolerant of uncertain scan...