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Automated test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automated testing system with minimized dependency on...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic activation of ASIC test mode

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic analog test and compensation with built-in pattern...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic built-in self-test of logic with seeding from...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic built-in self-test of logic with seeding from...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic fault-testing of logic blocks using internal...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic generation of user definable memory BIST circuitry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic parallel electronic component testing method and equip

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic retransmission query (ARQ) with inner code for generat

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic scan format selection based on scan topology...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic selection of a special mode of operation in multi-chan

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic self test of an integrated circuit component via...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic self-test system utilizing multi-sensor, multi-channel

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic self-testing of an internal device in a closed system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic shutdown or throttling of a bist state machine...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic test equipment methods and apparatus for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic test equipment scan test enhancement

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic test equipment using sigma delta modulation to...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Automatic test pattern generation for functional register...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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