Automatic built-in self-test of logic with seeding from...

Details Automatic built-in self-test of logic with seeding from... Automatic built-in self-test of logic with seeding from...

2008-03-18

2008-03-18

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000

Reexamination Certificate

active

10876864

ABSTRACT:
Built-in self-test (BIST) devices and methods are disclosed. A BIST section (100) according to one embodiment can include a built-in seed value memory (150) that stores multiple seed values. In a BIST operation, a seed value can be transferred from a built-in seed memory (150) to a test pattern generator (106) to generate multiple test patterns for scan chains (104-0to104-n). Successive seed values can be transferred to generate multiple test patterns sets at a clock speed and/or to achieve a desired test coverage.

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“Efficient Compression and Application of Deterministic Patterns in a Logic BIST Architecture”DAC 2003, Jun. 2-6, 2003.

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