Automatic fault-testing of logic blocks using internal...

Details Automatic fault-testing of logic blocks using internal... Automatic fault-testing of logic blocks using internal...

2008-07-08

2008-07-08

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07398443

ABSTRACT:
System and method for automatic fault-testing of a logic block and the interfaces of macros with logic gates inside a chip, using an at-speed logic-BIST internal to the chip. Following an initialization of internal storage elements, a set of test signals are generated and processed by the logic block. The output of the logic block is accumulated into a signature and compared to a reference signature to detect faults. Testing can be performed on an ATE (Automatic Test Equipment) using a simple test vector, or can be performed by a field engineer on the actual board comprising the chip.

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