Automatic self-testing of an internal device in a closed system

Details Automatic self-testing of an internal device in a closed system Automatic self-testing of an internal device in a closed system

2004-10-29

2008-10-14

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S025000, C714S030000, C714S047300, C714S703000, C714S733000, C714S742000, C714S745000, C600S300000, C604S891100, C607S032000, C607S033000

Reexamination Certificate

active

07437644

ABSTRACT:
A closed system such as a TET system in which self-testing of all components of the implantable medical device whose malfunction could negatively impact on the proper operation of the closed system is automatically and periodically performed without triggering from an external device. In addition, a closed system including automatic, periodic self-testing of the implantable medical device in which, whenever practical, testing of the components is synchronized with telemetric communication of the external device whereby an external RF field generated by the external device is used to supply necessary power to perform self-testing.

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