Automatic analog test and compensation with built-in pattern...

Details Automatic analog test and compensation with built-in pattern... Automatic analog test and compensation with built-in pattern...

2005-07-22

2008-09-23

Lamarre, Guy (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000, C714S733000

Reexamination Certificate

active

07428683

ABSTRACT:
A built-in-self test (BIST) scheme for analog circuitry functionality tests such as frequency response, gain, cut-off frequency, signal-to-noise ratio, and linearity measurement. The BIST scheme utilizes a built-in direct digital synthesizer (DDS) as the test pattern generator that can generate various test waveforms such as chirp, ramp, step frequency, two-tone frequencies, sweep frequencies, MSK, phase modulation, amplitude modulation, QAM and other hybrid modulations. The BIST scheme utilizes a multiplier followed by an accumulator as the output response analyzer (ORA). The multiplier extracts the spectrum information at the desired frequency without using Fast Fourier Transform (FFT) and the accumulator picks up the DC component by averaging the multiplier output.

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