Circuit including a built-in self-test
Circuit scan output arrangement
Circuit state scan-chain, data collection system and...
Circuit structure for testing microprocessors and test...
Circuit test pattern edition apparatus, circuit test pattern...
Circuit testing with ring-connected test instrument modules
Circuit testing with ring-connected test instrument modules
Circuit timing monitor having a selectable-path ring oscillator
Circuit to prevent inadvertent test mode entry
Circuit with expected data memory coupled to serial input lead
Circuitry for and system and substrate with circuitry for...
Circuitry for handling high impedance busses in a scan...
Circuitry to prevent peak power problems during scan shift
Circuitry with multiplexed dedicated and shared scan path cells
Circuits and associated methods for improved debug and test...
Circuits and methods for testing logic devices by modulating...
Circuits and methods for testing programmable logic devices...
Clock adjusting method and circuit device
Clock adjusting method and circuit device
Clock control circuit for test that facilitates an at speed...