Circuits and methods for testing programmable logic devices...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S724000, C714S736000, C326S039000, C326S041000

Reexamination Certificate

active

07111214

ABSTRACT:
Circuit implementations and test methods enable the testing of lookup table (LUT) input paths, “stuck at” memory cell values, and carry chains. One method includes storing a first bit pattern in each LUT, configuring the carry chain to perform a wide AND function of the LUT outputs, and cycling the inputs of each LUT while comparing the carry chain output to an expected value and reporting the PLD faulty if a difference is detected. The carry chain is configured to perform a wide OR function, and the cycling step is repeated. The bit pattern within each LUT is changed to the complement of the first bit pattern by providing a series of shift commands or by otherwise storing new values in the LUT, and the configuring and cycling steps are repeated. The invention also provides PLD circuit implementations that can be used to perform the described methods.

REFERENCES:
patent: 6118300 (2000-09-01), Wittig et al.
patent: 6326808 (2001-12-01), Fisk et al.
patent: 2002/0188903 (2002-12-01), Chu et al.
patent: 2003/0107937 (2003-06-01), Williams et al.
IBM Technical Disclosure Bulletin, Memory Self Test, Oct. 1, 1991, IBM, Issue 5, vol. 34, pp. 185-186.
Xilinx, Inc.; “Virtex-II Platform FPGA Handbook”; published Dec. 2000, available from Xilinx, Inc,, 2100 Logic Drive, San Jose, California 95124; pp. 33-75.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Circuits and methods for testing programmable logic devices... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuits and methods for testing programmable logic devices..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuits and methods for testing programmable logic devices... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3585816

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.