Circuits and associated methods for improved debug and test...

Details Circuits and associated methods for improved debug and test... Circuits and associated methods for improved debug and test...

2006-08-23

2009-11-10

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S819000, C710S260000

Reexamination Certificate

active

07617428

ABSTRACT:
Circuits and associated methods for testing internal operation of an application integrated circuit. Features and aspects hereof add configurable test interrupt circuits to an application circuit design to permit dynamic, configurable interrupt generation from an integrated circuit based on conditions determined from monitoring of internal signals of the application circuit. The internal signals that may be tested and used to generate test interrupts are those not exposed to the external processor interface of the integrated circuit and thus may be configured to interrupt based on any internal state of the application specific functional circuits of the integrated circuit.

REFERENCES:
patent: 5421027 (1995-05-01), Benzel et al.
patent: 5987556 (1999-11-01), Nakagawa et al.
patent: 7340575 (2008-03-01), Barret et al.
patent: 2006/0206646 (2006-09-01), Shrivastava et al.

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