System and method of determining the speed of digital...

System and method of providing error detection and...

System and method of providing error detection and...

System and method to control data capture

System and method to facilitate flexible control of bus...

System and method to predetermine a bitmap of a self-tested...

System and method to reduce scan test pins on an integrated...

System and method to test integrated circuits on a wafer

System and method to test internal PCI agents

System and method to test internal PCI agents

System and methods for authoring domain specific rule-driven...

System and methods of balancing scan chains and inserting...

System and scanout circuits with error resilience circuit

System and shadow circuits with output joining circuit

System configuration and methods for on-the-fly testing of integ

System debugging device and system debugging method

System for at-speed automated testing of high serial pin...

System for at-speed automated testing of high serial pin...

System for dynamic re-allocation of test pattern data for...

System for efficient utilization of multiple test systems