Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-10-02
2007-10-02
Lamarre, Guy (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S703000
Reexamination Certificate
active
11050996
ABSTRACT:
In one embodiment, an apparatus is provided with a system circuit, a scanout circuit and an error detecting circuit. The system circuit is adapted to generate a first output signal in response to a data input signal and a system clock signal. The scanout circuit is adapted to generate a second output signal in response the data input signal and the system clock signal. The error detecting circuit, coupled to the system circuit and the scanout circuit, is adapted to generate an error signal in response to a relative condition between the first output signal and the second output signal.
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Mak Tak M.
Mitra Subhasish
Zhang Ming
Zia Victor
Guerrier Merant
Intel Corporation
Lamarre Guy
Schwabe Williamson & Wyatt P.C.
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