System and method to test integrated circuits on a wafer

Details System and method to test integrated circuits on a wafer System and method to test integrated circuits on a wafer

2008-01-29

2008-01-29

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S765010, C714S716000

Reexamination Certificate

active

07325180

ABSTRACT:
A system to test integrated circuits on a wafer may include a transceiver formed on the wafer. The system may also include an antenna system couplable to the transceiver. The transceiver may be formed in one of a scribe line on the wafer, a chip on the wafer or on an otherwise unusable portion of the wafer. The antenna system maybe formed in at least one of the same scribe line as the transceiver or in at least one other scribe line formed in the wafer. Alternatively, the antenna system may include an antenna external to the wafer.

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