Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-12-11
2007-12-11
Kerveros, James C. (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
10242439
ABSTRACT:
A wrapper serial scan chain used during test of an integrated circuit is provided for a first functional block of circuitry and is segmented to provide a separately accessible wrapper serial scan chain segment that can be used to apply test to a second functional block of circuitry while bypassing the rest of the main wrapper serial scan chain.
REFERENCES:
patent: 5757819 (1998-05-01), Segars
Arm Limited
Kerveros James C.
Nixon & Vanderhye P.C.
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