Wrapper serial scan chain functional segmentation

Details Wrapper serial scan chain functional segmentation Wrapper serial scan chain functional segmentation

2007-12-11

2007-12-11

Kerveros, James C. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

10242439

ABSTRACT:
A wrapper serial scan chain used during test of an integrated circuit is provided for a first functional block of circuitry and is segmented to provide a separately accessible wrapper serial scan chain segment that can be used to apply test to a second functional block of circuitry while bypassing the rest of the main wrapper serial scan chain.

REFERENCES:
patent: 5757819 (1998-05-01), Segars

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