Wireless embedded test signal generation

Details Wireless embedded test signal generation Wireless embedded test signal generation

2011-01-18

2011-01-18

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S765010

Reexamination Certificate

active

07873884

ABSTRACT:
An RF/Microwave on-chip signal source for testing an integrated circuit embedded in a substrate is provided. The signal source includes an on-chip antenna embedded in the substrate to receive a signal from a signal source external to the substrate. The signal source also includes a frequency divider circuit also embedded in the substrate. The frequency divider converts one or more frequencies of the signal into an operating frequency of the integrated circuit, the signal at the operating frequency of the integrated circuit defining an on-chip test signal. The signal source further includes one or more output buffers embedded in the substrate to provide a signal interface with the integrated circuit.

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