Wireless no-touch testing of integrated circuits

Details Wireless no-touch testing of integrated circuits Wireless no-touch testing of integrated circuits

2007-02-20

2007-02-20

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000

Reexamination Certificate

active

10790906

ABSTRACT:
A wireless integrated circuit test method and system is presented. The invention allows testing of one or more integrated circuits configured with a wireless interface and a test access mechanism which controls input of test data received over a wireless connection from a test station to test structures which test functional blocks on the integrated circuit. Via the wireless connection, multiple integrated circuits or similarly equipped devices under test can be tested simultaneously. The invention also enables concurrent testing of independently testable functional blocks on any given integrated circuit under test.

REFERENCES:
patent: 6112067 (2000-08-01), Seike et al.
patent: 6189120 (2001-02-01), Akram
patent: 6412086 (2002-06-01), Friedman et al.
patent: 6807644 (2004-10-01), Reis et al.

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