LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery,Pulse or data error handling,Digital logic testing

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Testing hard-wired IP interface signals using a soft scan chain

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing hardware components to detect hardware failures

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing high I/O integrated circuits on a low I/O tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing IC functional and test circuitry having separate...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing IO timing in a delay locked system using separate...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing logic and embedded memory in parallel

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing mechanism in a semiconductor integrated circuit device u

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Testing method and apparatus assuring semiconductor device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing method for dynamic logic keeper device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing method for permanent electrical removal of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing method for permanent electrical removal of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing methodology for embedded memories using built-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing methods and chips for preventing asnchronous...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing mobile wireless devices during device production

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing mobile wireless devices during device production

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing mobile wireless devices during device production

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing of a programmable device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing of circuit with plural clock domains

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing of data retention latches in circuit devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing of data retention latches in circuit devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

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