Testing logic and embedded memory in parallel

Details Testing logic and embedded memory in parallel Testing logic and embedded memory in parallel

2006-09-05

2006-09-05

Kerveros, James C. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000

Reexamination Certificate

active

07103814

ABSTRACT:
Technique to perform logic and embedded memory tests using logic scan chain testing procedures in parallel with memory built in self test (BIST). This is accomplished with a combination of voltage isolation between memory and logic segments, and isolation between logic and memory test clocks. A test algorithm is introduced to enable and disable the scan chain operation during BIST operation.

REFERENCES:
patent: 3961251 (1976-06-01), Hurley et al.
patent: 4481627 (1984-11-01), Beauchesne et al.
patent: 5436910 (1995-07-01), Takeshima et al.
patent: 5535164 (1996-07-01), Adams et al.
patent: 5663965 (1997-09-01), Seymour
patent: 5680543 (1997-10-01), Bhawmik
patent: 5892721 (1999-04-01), Kim
patent: 5903576 (1999-05-01), Yoshiba
patent: 5954830 (1999-09-01), Ternullo
patent: 5987635 (1999-11-01), Kishi et al.
patent: 5996097 (1999-11-01), Evans et al.
patent: 6044481 (2000-03-01), Kornachuk et al.
patent: 6111800 (2000-08-01), Allan et al.
patent: 6122762 (2000-09-01), Kim
patent: 6125460 (2000-09-01), Sim
patent: 6324107 (2001-11-01), Allan et al.
patent: 6430718 (2002-08-01), Nayak
patent: 6587979 (2003-07-01), Kraus et al.
patent: 6650589 (2003-11-01), Clark

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