Testing IC functional and test circuitry having separate...

Details Testing IC functional and test circuitry having separate... Testing IC functional and test circuitry having separate...

2010-09-16

2011-11-08

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000, C714S740000

Reexamination Certificate

active

08055962

ABSTRACT:
Special test circuitry in an IC for wafer level testing selectively connects the specialized test circuitry to the functional circuitry during wafer test. Following wafer test the special test circuitry is electrically isolated from the functional circuitry and power supplies such that it does not load functional circuit signals nor consume power.

REFERENCES:
patent: 5084874 (1992-01-01), Whetsel, Jr.
patent: 5210759 (1993-05-01), DeWitt et al.
patent: 5254942 (1993-10-01), D'Souza et al.
patent: 5578935 (1996-11-01), Burns
patent: 6260165 (2001-07-01), Whetsel
Pradhan, M.M.; O'Brien, E.J.; Lam, S.L.; Beausang, J.; , “Circular BIST with partial scan,” Test Conference, 1988. Proceedings. New Frontiers in Testing, International , vol., no., pp. 719-729, Sep. 12-14, 1988 doi: 10.1109/TEST.1988.207857 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=207857&isnumber=5318.
Sasidhar, K.; Chatterjee, A.; Zorian, Y.; , “Optimal multiple chain relay testing scheme for MCMs on large area substrates,” Test Conference, 1996. Proceedings., International , vol., no., pp. 818-827, Oct. 20-25, 1996 doi: 10.1109/TEST.1996.557142 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=557142&isnumber=12091.

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