Testing mechanism in a semiconductor integrated circuit device u

Details Testing mechanism in a semiconductor integrated circuit device u Testing mechanism in a semiconductor integrated circuit device u

1998-02-26

2000-09-26

Moise, Emmanuel L.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

365233, 365201, G11C 2900

Patent

active

061254622

ABSTRACT:
A semiconductor integrated circuit device includes logic circuits for internally generating a desired pulse. Also, the device includes a plurality of logic stages for logical processes, the logic stages, in each logic stage, having constituent elements having sizes in common and having, between adjacent ones of the logic stages, parasitic capacitances and resistances in common. The semiconductor integrated circuit device can realize a minimum pulse width from a rising edge to a falling edge or from a falling edge to a rising edge of a pulse, which has been difficult to form in a testing device.

REFERENCES:
patent: 4504784 (1985-03-01), Goel et al.
patent: 5548621 (1996-08-01), Brady et al.

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