Simultaneous AC logic self-test of multiple clock domains
Simultaneously driving a hardware device and a software...
Single board DFT integrated circuit tester
Single event functional interrupt detection system
Single event upset tolerant microprocessor architecture
Single platform electronic tester
Single platform electronic tester
Single-ended transmission for direct access test mode within...
Single-pass methods for generating test patterns for...
Single-pass methods for generating test patterns for...
Single-pass, concurrent-validation methods for generating...
Skewed inverter delay line for use in measuring critical...
Skewed latch flip-flop with embedded scan function
Slack-based transition-fault testing
Smart capture for ATPG (automatic test pattern generation)...
Smart tester and method for testing a bus connector
Snoopy test access port architecture for electronic circuits...
Snoopy test access port architecture for electronic circuits...
Soc-based core scan chain linkage switch
Soft coding of multiple device IDs for IEEE compliant JTAG...