Single board DFT integrated circuit tester

Details Single board DFT integrated circuit tester Single board DFT integrated circuit tester

2006-04-25

2006-04-25

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S734000, C714S735000, C324S073100, C324S765010

Reexamination Certificate

active

07036062

ABSTRACT:
A design for test focused tester has a single printed circuit board tester architecture. By focusing on design for test testing and eliminating functional testing, the design for test focused tester reduces or eliminates requirements for high speed, precision signal formatting and timing circuitry that require a multiple board architecture interconnected via a high speed backplane. The single board architecture places a vector sequencer and vector memory close to the device under test, which provides short, consistent signal paths to the device and eliminates the need for dead cycles and synchronization between tester boards.

REFERENCES:
patent: 5260947 (1993-11-01), Posse
patent: 5654971 (1997-08-01), Heitele et al.
patent: 5899961 (1999-05-01), Sundermann
patent: 5948115 (1999-09-01), Dinteman
patent: 6826721 (2004-11-01), Williamson et al.

Affiliated with

Also associated with

Rating

Single board DFT integrated circuit tester does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Single board DFT integrated circuit tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Single board DFT integrated circuit tester will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3561943