Slack-based transition-fault testing

Details Slack-based transition-fault testing Slack-based transition-fault testing

2006-03-02

2009-06-09

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S741000, C716S030000

Reexamination Certificate

active

07546500

ABSTRACT:
A system that generates test patterns for detecting transition faults in an integrated circuit (IC). During operation, the system receives slack times for each net in the IC. Note that a slack time for a net is the minimum amount of delay that the given net can tolerate before violating a timing constraint. For each possible transition fault in the IC, the system uses the slack times for nets in the IC to generate a test pattern which exposes the transition fault by producing a transition that propagates along the longest path to the transition fault.

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