Test method and apparatus using energy consumption ratio

Test method and architecture for circuits having inputs

Test method and test apparatus for an electronic module

Test method and test circuit for electronic device

Test method and test circuit for electronic device

Test method and test device for electronic memories

Test method and test system for semiconductor device

Test method for a semiconductor integrated circuit having a...

Test method for data storage characteristics of memory

Test method for determining the wire configuration for...

Test method for guaranteeing full stuck-at-fault coverage of...

Test method for high speed semiconductor devices using a...

Test method for nonvolatile memory

Test method of cache memory of multiprocessor system

Test method of chips in a semiconductor wafer employing a test a

Test method of semiconductor intergrated circuit and test...

Test methodology based on multiple skewed scan clocks

Test mode circuit capable of surely resetting test mode signals

Test mode circuit of semiconductor memory device

Test mode control circuit