Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-08-29
2008-09-23
Chung, Phung M. (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S723000, C714S738000, C714S736000
Reexamination Certificate
active
07428673
ABSTRACT:
The invention relates to a test method for determining a wire configuration for a circuit carrier having at least one component arranged thereon, where internal lines in the component are connected to component connections in a prescribed order, and where the component connections are wired to connections on the circuit carrier. According to the method, a respective prescribed test signal is applied to each internal line of the component using a controllable test signal generator integrated in the component. Output signals applied to the connections of the circuit carrier are tapped off. Thereafter, the respective output signals tapped off are identified with the corresponding test signals applied to the internal lines of the component using an external test apparatus for determining the wire configuration between the component connections and circuit carrier connections.
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Biewenga et al., “Static Component Interconnect Test Technology (SCITT), A New Technology for Assembly Testing”, ITC International Test Conference, 1999, pp. 439-448, (10 pages).
Kliewer Jörg
Versen Martin
Chung Phung M.
Infineon - Technologies AG
Maginot Moore & Beck
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