Test method and test apparatus for an electronic module

Details Test method and test apparatus for an electronic module Test method and test apparatus for an electronic module

2007-02-13

2007-02-13

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S718000, C365S201000

Reexamination Certificate

active

10389580

ABSTRACT:
A method for testing an electronic module having a memory cell device includes writing an information item to the memory cell device at a first clock frequency and then reading-out the information item from the memory cell device at a second clock frequency. The read out information item is reflected at a reflection point and is written back to the memory cell device at the second clock frequency. The reflected information unit is then read-out from the memory cell device with the first clock frequency.

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patent: 4562488 (1985-12-01), Koyama et al.
patent: 5091884 (1992-02-01), Kagami
patent: 5267206 (1993-11-01), Koyabu
patent: 2002/0012286 (2002-01-01), Ernst et al.
patent: 100 34 897 (2002-01-01), None

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