Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-12-29
2008-10-07
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S005110, C714S724000, C714S733000, C714S734000, C714S742000, C365S201000, C365S222000
Reexamination Certificate
active
07434120
ABSTRACT:
Provided is a test mode control circuit capable of preventing an MRS (mode register set) from changing in a test mode exit after a test mode entry. In the test mode control circuit, an MRS controller logically combines an MRS signal, a bank address, an MRS address, and a test mode control signal to output a latch control signal. A test mode control unit detects a test mode entry and a test mode exit to selectively activate one of a test mode set signal and a test mode exit signal, and outputs the test mode control signal having different voltage levels according to an activation state of the test mode set signal or the test mode exit signal. An address latch latches an input address when the MRS signal is activated, and outputs the latched input address as the MRS address when the latch control signal is activated.
REFERENCES:
patent: 5905690 (1999-05-01), Sakurai et al.
patent: 6256240 (2001-07-01), Shinozaki
patent: 6343048 (2002-01-01), Jung
patent: 6392909 (2002-05-01), Jang et al.
patent: 6633504 (2003-10-01), Lee et al.
patent: 6809975 (2004-10-01), Yamaoka et al.
patent: 6862667 (2005-03-01), Asakawa et al.
patent: 6909650 (2005-06-01), Ryu et al.
patent: 7017090 (2006-03-01), Endou et al.
patent: 7035753 (2006-04-01), Gerstmeier et al.
patent: 7107500 (2006-09-01), Jang
patent: 2002/0014635 (2002-02-01), Lee et al.
patent: 2002/0167859 (2002-11-01), Chun
patent: 2003/0026139 (2003-02-01), Endou et al.
patent: 2004/0252564 (2004-12-01), Do
patent: 2006/0036916 (2006-02-01), Janzen
patent: 2001195898 (2001-07-01), None
patent: 2004014037 (2004-01-01), None
patent: 2005116167 (2005-04-01), None
patent: 10-2004-0095892 (2004-11-01), None
patent: 10-2005-0003062 (2005-01-01), None
patent: 10-2005-0058873 (2005-06-01), None
patent: 10-2005-0064597 (2005-06-01), None
Jang Ji-Eun
Park Kee-Teok
Blakely & Sokoloff, Taylor & Zafman
Hynix / Semiconductor Inc.
Trimmings John P
LandOfFree
Test mode control circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test mode control circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test mode control circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3994267