Test mode control circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Details

C714S005110, C714S724000, C714S733000, C714S734000, C714S742000, C365S201000, C365S222000

Reexamination Certificate

active

07434120

ABSTRACT:
Provided is a test mode control circuit capable of preventing an MRS (mode register set) from changing in a test mode exit after a test mode entry. In the test mode control circuit, an MRS controller logically combines an MRS signal, a bank address, an MRS address, and a test mode control signal to output a latch control signal. A test mode control unit detects a test mode entry and a test mode exit to selectively activate one of a test mode set signal and a test mode exit signal, and outputs the test mode control signal having different voltage levels according to an activation state of the test mode set signal or the test mode exit signal. An address latch latches an input address when the MRS signal is activated, and outputs the latched input address as the MRS address when the latch control signal is activated.

REFERENCES:
patent: 5905690 (1999-05-01), Sakurai et al.
patent: 6256240 (2001-07-01), Shinozaki
patent: 6343048 (2002-01-01), Jung
patent: 6392909 (2002-05-01), Jang et al.
patent: 6633504 (2003-10-01), Lee et al.
patent: 6809975 (2004-10-01), Yamaoka et al.
patent: 6862667 (2005-03-01), Asakawa et al.
patent: 6909650 (2005-06-01), Ryu et al.
patent: 7017090 (2006-03-01), Endou et al.
patent: 7035753 (2006-04-01), Gerstmeier et al.
patent: 7107500 (2006-09-01), Jang
patent: 2002/0014635 (2002-02-01), Lee et al.
patent: 2002/0167859 (2002-11-01), Chun
patent: 2003/0026139 (2003-02-01), Endou et al.
patent: 2004/0252564 (2004-12-01), Do
patent: 2006/0036916 (2006-02-01), Janzen
patent: 2001195898 (2001-07-01), None
patent: 2004014037 (2004-01-01), None
patent: 2005116167 (2005-04-01), None
patent: 10-2004-0095892 (2004-11-01), None
patent: 10-2005-0003062 (2005-01-01), None
patent: 10-2005-0058873 (2005-06-01), None
patent: 10-2005-0064597 (2005-06-01), None

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