I/O based column redundancy for virtual ground with 2-bit...

I/O compression circuit for a semiconductor memory device

I/O device testing method and apparatus

I/O switches and serializer for each parallel scan register

I2C test single chip

Ibist identification loopback scheme

IBIST interconnect and bridge fault detection scheme

IBIST test for synchronous lines at multiple frequencies

IC chip tester using compressed digital test data and a method f

IC functional and delay fault testing

IC input memory with dual data and dual control inputs

IC measuring device

IC multiplexer control circuitry for tap selection circuitry

IC tap/scan test port access with tap lock circuitry

IC test cell with memory output connected to input multiplexer

IC test equipment, measurement method in the IC test equipment,

IC test software system for mapping logical functional test...

IC test system

IC test system and storage medium for the same

IC tester