Wafer burn-in design for DRAM and FeRAM devices
Wafer burn-in test mode circuit
Wafer scale testing using a 2 signal JTAG interface
Wafer scale testing using a 2 signal JTAG interface
Waveform controller for an IC tester
Waveform generating circuit
Waveform generator, semiconductor testing device and...
Weak bit testing
Weighted decoding method and circuits for Comma-Free...
Weighted error/erasure correction in a multi-track storage...
Weighted interleaving for correlated channel coding
Weighted random pattern built-in self-test
Window based stall avoidance mechanism for high speed...
Wireless access modem having downstream channel...
Wireless communication method and apparatus for detecting...
Wireless communication method and system for detecting and...
Wireless communication system having error-control coder and...
Wireless communications apparatus and method
Wireless communications system
Wireless embedded test signal generation