Test method and test circuit for electronic device

Details Test method and test circuit for electronic device Test method and test circuit for electronic device

2006-04-11

2006-04-11

Torres, Joseph (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C379S022010, C370S249000

Reexamination Certificate

active

07028235

ABSTRACT:
A method of testing an electronic device including first and second semiconductor devices connected to each other with a plurality of bus lines. First, the first semiconductor device supplies a selected one of the bus lines with a first logical output signal. Then, the second semiconductor device acquires a first bus line signal from the selected bus line. The second semiconductor device inverts the first bus line signal to generate a second logical output signal. The second semiconductor device transmits the second logical output signal to the first semiconductor device. The first semiconductor device receives a second bus line signal from the selected bus line. The first semiconductor device compares the first logical output signal and the second bus line signal to detect a connection between the first semiconductor device and the second semiconductor device.

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Office Action for Japanese Application No. 11-037910, dated Jun. 21, 2005.

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