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Fabric-based high speed serial crossbar switch for ATE

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
Reexamination Certificate

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Fabrication of test logic for level sensitive scan on a circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Fabrication process acceptance tester and fabrication process us

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Facilitating error detection for content addressable memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Fail array memory control circuit with selective input disable

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Fail-safe system monitoring and safety communication network

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
Patent

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Failsafe RLC reset method for a wireless communication system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate

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Failure analysis and testing of semi-conductor devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure analysis and testing of semi-conductor devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure analysis and testing of semi-conductor devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure analysis device for IC tester and memory device measurin

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Failure analysis memory for semiconductor memory testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Failure analysis system and failure analysis method of logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure capture apparatus and method for automatic test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure counting method and device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
Patent

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Failure detection and isolation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
Reexamination Certificate

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Failure diagnostic apparatus, failure diagnostic system, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure isolation and repair techniques for integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure prediction circuit and method, and semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Failure-data storage system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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