Test method and test device for electronic memories

Details Test method and test device for electronic memories Test method and test device for electronic memories

2006-10-24

2006-10-24

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S724000, C714S718000, C714S738000

Reexamination Certificate

active

07127650

ABSTRACT:
A test method for electronic memories includes reading out a previously defined test pattern sequentially as a time-dependent signal from the memory, determining the associated spectrum from the time-dependent signal by Fourier transformation, and assessing the memory to be tested using the spectrum. Also included is a suitable test device for the method.

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