Using statistical signatures for testing high-speed circuits

Details Using statistical signatures for testing high-speed circuits Using statistical signatures for testing high-speed circuits

2008-01-29

2010-02-09

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S732000

Reexamination Certificate

active

07661052

ABSTRACT:
A method and system for testing a high-speed circuit is disclosed. The method and system include obtaining a high-speed statistical signature of the high-speed circuit using a conventional tester. The method and system further include comparing the high-speed statistical signature of the high-speed circuit to an expected signature. Consequently, it can be determined whether the high-speed circuit functions within the desired parameters.

REFERENCES:
patent: 3916306 (1975-10-01), Patti
patent: 4204633 (1980-05-01), Goel
patent: 4241307 (1980-12-01), Hong
patent: 4801870 (1989-01-01), Eichelberger et al.
patent: 4870425 (1989-09-01), Gunny
patent: 5012471 (1991-04-01), Powell et al.
patent: 5019899 (1991-05-01), Boles et al.
patent: 5212601 (1993-05-01), Wilson
patent: 5301156 (1994-04-01), Talley
patent: 5329559 (1994-07-01), Wong et al.
patent: 6201829 (2001-03-01), Schneider
patent: 6396768 (2002-05-01), Ooishi

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