Internal guardband for semiconductor testing
Internal guardband for semiconductor testing
Internal self-test circuit for a memory array
Internally generated vectors for burnin system
Intest security circuit for boundary-scan architecture
Inversion of scan clock for scan cells
Inversion of scan clock for scan cells
Inverted TCK access port selector selecting one of plural TAPs
IP core design supporting user-added scan register option
IP core design supporting user-added scan register option
IR code instrumentation
Isolating the location of defects in scan chains
Isolation testing circuit and testing circuit optimization...
Isolation/removal of faults during LBIST testing