Isolating the location of defects in scan chains

Details Isolating the location of defects in scan chains Isolating the location of defects in scan chains

2006-03-20

2009-02-24

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07496816

ABSTRACT:
A system and method for isolating defects in scan chains by performing diagnostics fault simulation on chosen faults that are consistent with the nature of a scan chain defect, while keeping information about predictable failures. The effects of defects at specific locations on the scan chain are modeled by compositing the effects of a subset of the faults for each defect. Each composite, which models a specific scan chain defect, is evaluated in terms of how well it predicts the failures measured at a tester, and assigned a score based on that evaluation. The composite with the highest score identifies the modeled defect which is the closest to predicting the results measured at the tester, and therefore the location on the scan chain that has the highest probability of containing the actual defect.

REFERENCES:
patent: 5189365 (1993-02-01), Ikeda et al.
patent: 5663967 (1997-09-01), Lindberg et al.
patent: 6694454 (2004-02-01), Stanley
patent: 2003/0131294 (2003-07-01), Motika et al.
patent: 2005/0229057 (2005-10-01), Anderson et al.
patent: 2007/0011523 (2007-01-01), Burdine et al.

Affiliated with

Also associated with

Rating

Isolating the location of defects in scan chains does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Isolating the location of defects in scan chains, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Isolating the location of defects in scan chains will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4097769