Inversion of scan clock for scan cells

Details Inversion of scan clock for scan cells Inversion of scan clock for scan cells

2004-07-29

2008-11-04

Louis-Jacques, Jacques (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000, C714S731000

Reexamination Certificate

active

07447961

ABSTRACT:
In one embodiment, an apparatus comprises a scan circuit including at least a first and a second clock domain and a scan chain having a first plurality of scan cells positioned in the first clock domain and a second plurality of scan cells positioned in the second clock domain. A scan clock source, coupled to the scan chain, generates a first scan clock signal to the first plurality of scan cells and a second scan clock signal to the second plurality of scan cells. The first and the second clock signals have an inverted relationship.

REFERENCES:
patent: 5450418 (1995-09-01), Ganapathy
patent: 5570375 (1996-10-01), Tsai et al.
patent: 5619511 (1997-04-01), Sugisawa et al.
patent: 5668490 (1997-09-01), Mitra et al.
patent: 5828579 (1998-10-01), Beausang
patent: 6070260 (2000-05-01), Buch et al.
patent: 6114892 (2000-09-01), Jin
patent: 6185710 (2001-02-01), Barnhart
patent: 6266801 (2001-07-01), Jin
patent: 6269463 (2001-07-01), Duggirala et al.
patent: 6374380 (2002-04-01), Sim
patent: 6393592 (2002-05-01), Peeters et al.
patent: 6412098 (2002-06-01), Jin
patent: 6518788 (2003-02-01), Kasahara
patent: 6640324 (2003-10-01), Goldovsky
patent: 6728915 (2004-04-01), Whetsel
patent: 6877123 (2005-04-01), Johnston et al.
patent: 2003-202362 (2003-07-01), None
Makar, Handling Multiple Clock Domains in Scan Design, 1999, EETimes Online (Google.com), pp. 1-6.
Saxena et al., Scan-based Transition Fault Testing—Implementation and Low Cost Test Challenges, Apr. 2002, IEEE, pp. 1120-1129.

Affiliated with

Also associated with

Rating

Inversion of scan clock for scan cells does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inversion of scan clock for scan cells, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inversion of scan clock for scan cells will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4050361