Semiconductor memory device with reduced package test time
Semiconductor memory device with spare memory cell
Semiconductor memory device with ZQ calibration
Semiconductor memory device, and method of checking the...
Semiconductor memory device, memory system having...
Semiconductor memory having error correction
Semiconductor memory having error correction
Semiconductor memory having sub-party cell array error...
Semiconductor memory having sub-party cell array error...
Semiconductor memory implementing internally generated commands
Semiconductor memory improved for testing
Semiconductor memory in which error correction is performed...
Semiconductor memory self-test controllable at board level...
Semiconductor memory system performing data error correction...
Semiconductor memory test apparatus and method for address...
Semiconductor memory test circuit and method for the same
Semiconductor memory test device
Semiconductor memory testing apparatus
Semiconductor memory testing apparatus
Semiconductor memory testing device