Semiconductor memory device with ZQ calibration

Details Semiconductor memory device with ZQ calibration Semiconductor memory device with ZQ calibration

2007-12-31

2010-12-14

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S718000, C326S030000, C324S601000, C438S018000, C365S201000

Reexamination Certificate

active

07853842

ABSTRACT:
A semiconductor memory device is capable of outputting calibration codes to an external circuit. The semiconductor memory device includes a data output control unit for controlling an output of data, a calibration code output control unit for transmitting calibration codes to determine a termination resistance value, a test mode signal generating unit for generating a test mode signal which is enabled in the test mode for outputting the calibration codes, and a test mode control unit for selectively outputting the data or the calibration codes in response to the test mode signal.

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