Semiconductor memory device having test address generating...

Semiconductor memory device having test mode

Semiconductor memory device having time reduced in testing...

Semiconductor memory device parallel bit test circuits

Semiconductor memory device requiring performance of...

Semiconductor memory device testable with a single data rate...

Semiconductor memory device with a test mode

Semiconductor memory device with data scramble circuit

Semiconductor memory device with reduced package test time

Semiconductor memory device with ZQ calibration

Semiconductor memory device, memory system having...

Semiconductor memory implementing internally generated commands

Semiconductor memory improved for testing

Semiconductor memory test apparatus and method for address...

Semiconductor memory test circuit and method for the same

Semiconductor memory test device

Semiconductor memory testing apparatus

Semiconductor memory testing device

Semiconductor memory testing device and method of testing...

Semiconductor memory testing device and method of testing...