Bad block identifying method for flash memory, storage...

Bad page marking strategy for fast readout in memory

BCA data replay

Buffered memory module and method for testing same

Built in self test BIST for RAMS using a Johnson counter as a so

Built-in redundancy analysis for memories with row and...

Built-in self test (BIST) architecture having distributed...

Built-in self test for multiple memories in a chip

Built-in self test system and method for two-dimensional...

Built-in self-repair of semiconductor memory with redundant...

Built-in self-repair wrapper methodology, design flow and...

Built-in self-test (BIST) architecture having distributed...

Built-in self-test (BIST) of memory interconnect

Built-in test for multiple memory circuits

Built-in test method for content addressable memories

Built-in test support for an integrated circuit

Burn-in mode detect circuit for semiconductor device