Semiconductor memory device having test address generating...

Details Semiconductor memory device having test address generating... Semiconductor memory device having test address generating...

2008-06-19

2011-11-01

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

08051341

ABSTRACT:
A semiconductor memory device includes a test address generating circuit configured on the device. The test address generating circuit generates a plurality of test addresses for a test of the semiconductor memory device in response to at least one externally applied test address generation signal. As a result, the number of DUTs can increase, based on a reduction of required address pins, and manufacturing productivity and test efficiency of semiconductor memory devices can increase.

REFERENCES:
patent: 4451918 (1984-05-01), Gillette
patent: 4835774 (1989-05-01), Ooshima et al.
patent: 5506849 (1996-04-01), Kato
patent: 5721708 (1998-02-01), Tsai et al.
patent: 5812559 (1998-09-01), Nakaide et al.
patent: 6009028 (1999-12-01), Akiyama
patent: 6173238 (2001-01-01), Fujisaki
patent: 6175529 (2001-01-01), Otsuka et al.
patent: 6415399 (2002-07-01), Yamaoka
patent: 6694461 (2004-02-01), Treuer
patent: 6769084 (2004-07-01), Kim et al.
patent: 7013414 (2006-03-01), Takeshige et al.
patent: 7228470 (2007-06-01), Saito
patent: 7313740 (2007-12-01), Ong
patent: 7444575 (2008-10-01), Ong
patent: 7500171 (2009-03-01), Suzuki
patent: 2002/0194557 (2002-12-01), Park
patent: 05282900 (1993-10-01), None
patent: H10031885 (1998-02-01), None
patent: 1998013729 (1998-05-01), None
patent: 20010001462 (2001-01-01), None
patent: 1020070002806 (2007-01-01), None
Office Action issued on Oct. 31, 2008 in related Korean Patent Application No. 10-2007-0064121.
Decision of Grant issued on May 26, 2009 in related Korean Patent Application No. 10-2007-0064121.

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