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Tamper resistant shadow memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Techniques for testing memory circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test and bring-up of an enhanced cascade interconnect memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus and test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus and test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus and test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus and test method for testing a plurality of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus, and method of manufacturing semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus, phase adjusting method and memory controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus, program, and test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test arrangement for memory devices using a dynamic row for crea

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test bus architecture for embedded RAM and method of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test circuit and method for multilevel cell flash memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test circuit and method for multilevel cell flash memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test circuit and method for multilevel cell flash memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test circuit and method for multilevel cell flash memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test circuit and method for testing an integrated memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test circuit for memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test circuit for reducing test time in semiconductor memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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