Scanned memory testing of multi-port memory arrays
Scanning reassigned data storage locations
Scheme for the reduction of extra standby current induced by...
SDRAM address error detection method and apparatus
Self test apparatus for identifying partially defective memory
Self verification of non-volatile memory
Self-test and correction of loss of charge errors in a flash...
Self-test circuit and memory device incorporating it
Self-test of a memory device
Self-test RAM using external synchronous clock
Self-test RAM using external synchronous clock
Self-test ram using external synchronous clock
Self-test ram using external synchronous clock
Self-testing of DRAMs for multiple faults
Self-testing of magneto-resistive memory arrays
Semi-conductor component test device, in particular data...
Semiconductor component for controlling power semiconductor...
Semiconductor device
Semiconductor device
Semiconductor device