Pad connection structure of embedded memory devices and...
Parallel bit test apparatus and parallel bit test method...
Parallel bit test circuit and method for semiconductor...
Parallel bit test circuit for testing a semiconductor device in
Parallel bit test circuit in semiconductor memory device and...
Parallel bit test circuits for testing semiconductor memory...
Parallel bit testing circuits and methods for integrated...
Parallel burning system and method
Parallel test circuit for semiconductor memory device
Parallel test circuit of semiconductor memory device
Partitionable embedded circuit test system for integrated...
Pattern generating apparatus
Pattern generator for memory burn-in and test
Portable information device, method for recovering data in...
Pre-code device, and pre-code system and pre-coding method...
Prediction of impact on post-repair yield resulting from...
Procedure and device for identifying an operating mode of a...
Process and device for testing a memory element
Process for editing of data, in particular with variable channel
Process for manufacturing semiconductor device