LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for analyzing membrane structure and apparatus therefor

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for analyzing monocrystalline parts by X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for detecting a mass density image of an object

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for detecting a mass density image of an object

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for detecting an image of an object

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for determination of elastic strains present in...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for determining a gsm substance and/or a chemical...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for determining parameters of a unit cell of a...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for determining unknown structure of crystal

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for developing an x-ray diffraction imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for estimating the press formability of galvannealed stee

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for evaluating an SOI substrate, evaluation...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for evaluating residual fatigue life of mechanical parts

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for examining a body with penetrating radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for foreseeing residual life of structural member making

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for identifying desired features in a crystal

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for improve x-ray diffraction determinations of residual

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for locating and evaluating subsurface uranium deposits h

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for manufacturing a reflector for X-ray radiation