Search
Selected: H

Hand-held contraband detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Handling support for X-ray spectroscopic analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High efficiency replicated x-ray optics and fabrication method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High energy resolution, high angular acceptance crystal monochro

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High precision posture control method of X-ray mirror

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High resolution direct-projection type x-ray microtomography...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High resolution direct-projection type x-ray microtomography...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High resolution direct-projection type x-ray microtomography...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High resolution technique and instrument for measuring lattice p

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High throughput reflectivity and resolution x-ray dispersive and

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High throughput X-ray diffraction filter sample holder

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

High voltage x-ray generator and related oil well formation...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Highly aligned x-ray optic and source assembly for precision...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Hybrid x-ray mirrors

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Hybrid x-ray mirrors

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.