LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

An image focusing means by using an opaque object to diffract x-

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Analysis device with variably illuminated strip detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Analysis methods for energy dispersive X-ray diffraction pattern

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Analysis of macromolecules, ligands and macromolecule-ligand...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Analytical method for determination of crystallographic...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Analyzing apparatus and analyzing method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Angle dispersive x-ray spectrometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for detecting items in objects

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for focusing hard X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for generating a high intensity X-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for generating monochromatic X-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for imaging with wavefields using inverse s

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for in-situ measurement of residual...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for inspecting a crystal

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for measuring the orientation of a single c

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for measuring the roughness of a target mat

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for precise determinations of crystallograp

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for stirring fluid borne particles

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Apparatus and method for texture analysis on semiconductor...