LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Dental colorimetry apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Detecting unit for X-ray diffraction measurements

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Detection methods and apparatus for non-destructive inspection o

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Detection of concealed explosives and contraband

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Detection of explosives and other materials using resonance fluo

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Determination of material parameters

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Determining the existence of misorientation in a crystal

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device and method for the inspection of the condition of a...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for detecting nitrogenous, phosphoric, chloric and oxygen

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for determining the mass per unit volume of an elementary

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for examining a body by means of gamma rays or X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for examining a test object by means of gamma or X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for measuring the momentum transfer spectrum of X-ray qua

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for measuring the orientation of bulk monocrystalline mat

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for measuring the pulse transfer spectrum of elastically

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for micro-manipulation of small samples

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Device for processing a measured signal corresponding to the int

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Diffraction crystal for sagittally focusing x-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Diffraction device which detects the Bragg condition