X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-07-11
2006-07-11
Bruce, David V. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S084000
Reexamination Certificate
active
07076025
ABSTRACT:
A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitted from the crystal analyzer onto a detector and digitized. A first image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a first angular position. A second image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a second angular position. The first image and the second image are combined mathematically to derive a mass density image of the object.
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Chapman Leroy Dean
Hasnah Moumen O.
Bruce David V.
Illinois Institute of Technology
Pauley Peterson & Erickson
Song Hoon
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