Method for developing an x-ray diffraction imaging system

Details Method for developing an x-ray diffraction imaging system Method for developing an x-ray diffraction imaging system

2006-08-02

2009-02-17

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S098000, C378S087000

Reexamination Certificate

active

07492863

ABSTRACT:
A method for developing a virtual representation of an x-ray diffraction imaging system includes generating a symmetry axis, generating a conical shape having a base diameter, a vertex angle α, and a vertex point, locating the vertex point at an origin point on the symmetry axis, and extending a first line and a second line between the vertex point and the conical base such that the first line is separated an angle dφfrom the second line in an azimuthal direction around the conical base.

REFERENCES:
patent: 2005/0002488 (2005-01-01), Ozawa et al.
patent: 2005/0190881 (2005-09-01), Obata et al.
Geoffrey Harding; “The Design of Direct Tomographic, Energy-Dispersive, X-Ray Diffraction Imaging (XDI) Systems”; Dated Jul. 13, 2005; Presented at SPIE Conference on Aug. 3, 2005; 9 pgs.

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