X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1980-09-10
1983-04-19
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 6, G01N 2320
Patent
active
043808174
ABSTRACT:
Devices that measure the electron density in a body by means of radiation scattered from a narrow pencil beam of penetrating radiation directed through the body, produce defective images on reconstruction of the density distribution because of multiple scattering of radiation. This can of course be reduced by scattered ray diaphragms, but cannot be eliminated entirely. The invention therefore provides a means for detecting the size of the multiple scattered radiation component be measurement. For this purpose, the detector array which measures radiation including the single scattered radiation, is screened, at least osscasionally, from the single scattered radiation and the detected intensity values measured by the detector elements when so screened, are used to correct the values generated by measuring the detected radiation including the single scattered radiation.
REFERENCES:
patent: 4229651 (1980-10-01), Danos
patent: 4258256 (1981-03-01), Harding
patent: 4286156 (1981-08-01), Wagner
Harding Geoffrey
Wagner Wolfgang
Church Craig E.
Haken Jack E.
U.S. Philips Corporation
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